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MIL STD 750 and 883 Training

MIL-STD-750/883 standards verify and control the consistency of the protocols for evaluating semiconductors and microcircuits.

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The MIL-STD-750 and MIL-STD-883 standards are also about integrating the essential environmental tests to identify the tolerance of these instruments toward harmful sectors of environmental elements and conditions during the military missions, and physical and electrical tests.

The MIL-STD-750 standard establishes uniform methods for testing semiconductor devices, including basic environmental tests to determine resistance to deleterious effects of natural elements and conditions surrounding military operations, and physical and electrical tests.

For the purpose of this standard, the term “devices” includes such items as transistors, diodes, voltage regulators, rectifiers, tunnel diodes and other related parts. This standard is intended to apply only to semiconductor devices.

The MIL-STD-883 standard establishes uniform methods, controls and procedures for testing microelectronic devices suitable for use within military and aerospace electronic systems.

This includes basic environmental tests to determine resistance to deleterious effects of natural elements and conditions surrounding military and space operations; mechanical and electrical tests; workmanship and training procedures; and such other controls and constraints as have been deemed necessary to ensure a uniform level of quality and reliability suitable to the intended applications of those devices.

MIL STD 750/883 standards provide test methods including:

  • Environmental tests (1000 series)
  • Mechanical characteristics tests (2000 series)
  • Electrical characteristics tests for bipolar transistors (3000 series)
  • Circuit-performance and thermal resistance measurements (3100 series)
  • Low frequency tests (3200 series)
  • High frequency tests (3300 series)

MIL STD 750 and 883 Training Course Description

MIL STD 750/883 Training provides you with the detailed materials addressed in the sections of the MIL-STD 883 Test Method Standard Microcircuits and MIL-STD 750 Test Method Standard for Semiconductor Devices. We help you to understand these standards, know how to read them, learn how to implement them in your organization. We understand that often extracting test procedures and requirements from official materials and standards, and adjusting them to the needs of your organization is very challenging. MIL STD 750/883 Training intends to make this part of the work easier so that you can focus on performing them properly.

These standards regulate coherent procedures for testing semiconductors and microcircuits, incorporating fundamental environmental tests to determine resistance to harmful properties of environmental components and circumstances round military operations, and physical and electrical tests.

MIL STD 750 and 883 Training

Tonex Training Format

MIL STD 750/883 Training course is a combination of lectures and optional hands-on activities, including optional labs at customer sites when appliacable, practical activities, and workshops based on availability and customer lab environment. The labs are conducted at customer sites using their lab environment using relevant tools and instruments, and the practical exercises and optional hands-on workshops are designed based on real-world problems and projects related to the project.

Audience

MIL STD 750/883 Training is a 3-day course designed for:

  • Testing engineers
  • Testing technicians
  • Instrumental engineers
  • Quality engineers for instruments
  • Troubleshooting team personnel, involved in resolving the microcircuits and semiconductors
  • Professionals involved in developing and overseeing the test methods of microcircuits and semiconductors
  • The individuals who work with microcircuits and semiconductors

Learning Objectives

Upon the completion of MIL STD 750/883 Training, the attendees will:

  • Learn about the scope, purposes, and applications of each MIL STD 750 and 883
  • Learn the terminology and acronyms used in these standards
  • Learn the concepts and rationale behind each of these standards
  • Become aware of the recent updates associated with these standards
  • Learn the methods and procedures
  • Adjust the test methods and apply them
  • Develop protocols to follow these standards

Course Outline

Overview of MIL STD 750/883

  • MIL-STD-750 definitions
  • MIL-STD-883 definitions
  • What are microcircuits
  • What are semiconductors
  • Applications of microcircuits and semiconductors
  • Importance of MIL STD 750 and 883
  • Background of MIL-STD-750
  • Background of MIL-STD-883

Introduction to MIL-STD-750

  • Scope
  • Purpose
  • Numbering system
  • Methods of reference

Application Documents

  • General
  • Government documents
  • Specifications, standards, and handbooks
    • Government documents, drawings, and publications
    • Non-Government publications
  • Order of precedence
  • Definitions
    • Symbols, and definitions
    • Abbreviations used in this standard

General Requirements

  • Test conditions
    • Permissible temperature variation in environmental chambers
    • Electrical test frequency
    • Accuracy
    • Test methods and circuits
    • Calibration requirements
  • Orientations
  • General precautions
    • Transients
    • Test conditions for electrical measurements
    • Steady-state dc measurements (method 4000)
    • Pulse measurements
    • Test circuits
    • Test method variation
    • Soldering
    • Order of connection of leads
    • Radiation precautions
    • Handling precautions
  • Continuity verification tests
    • Bias disruption
  • Requirements for HTRB and burn-in
  • Bias requirements
  • Destructive tests
  • Non-destructive tests
  • Laboratory suitability
  • Recycled, recovered, or environmentally preferable materials

Considerations

  • Intended Use
  • International standardization agreement
  • Subject term (key word) listing
  • Updates

Test Methods

  • Environmental tests (1000 series)
  • Mechanical characteristics tests (2000 series)
  • Electrical characteristics tests for bipolar transistors (3000 series)
  • Circuit-performance and thermal resistance measurements (3100 series)
  • Low frequency tests (3200 series)
  • High frequency tests (3300 series)
  • Electrical characteristics tests for MOS field-effect transistors (3400 series)
  • Electrical characteristics tests for Gallium Arsenide transistors (3500 series)
  • Electrical characteristics tests for diodes (4000 series)
  • Electrical characteristics tests for microwave diodes (4100 series)
  • Electrical characteristics tests for thyristors (controlled rectifiers) (4200 series)
  • Electrical characteristics tests for tunnel diodes (4300 series)
  • High reliability space application tests (5000 series)

Introduction to MIL-STD-883

  • Scope
  • Intended use of or reference to MIL-STD-883

Application Documents

  • General
  • Government documents
  • Order of precedence
  • Definitions
    • Symbols, and definitions
    • Abbreviations used in this standard

General Requirements

  • Numbering system
  • Test results
  • Test sample disposition
  • Orientation
  • Test conditions
  • General precautions
  • Recycled, recovered, and environmentally preferable materials 

Test Methods

  • Environmental tests
  • Mechanical characteristics tests
  • Electrical tests (3000 series)
  • Electrical tests (4000 series)
  • Reliability tests (5000 series)

Tonex Sample Workshop

  • Discussing both MIL-STD 750 and 833 for Large Scale Integrated Circuits Development and Acquisition for Space Vehicles
  • MIL-STD 750/833 test methods for the irradiation parts
    • Method 1017 – Neutron Irradiation
    • Method 1019 – Ionizing Radiation Test Procedure
    • Method 1032 – Package-Induced Soft Error Test Procedure
    • Method 1080 – Single Event Burnout and Single Event Gate Rupture
    • Method 3478 – Power MOSFET Electrical Dose Rate Test Method
    • Method 5001 – Wafer Lot Acceptance Testing

MIL STD 750/883 Training

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