Price: $2,458.00

Length: 3 Days
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MIL STD 750 and 883 Training

MIL STD 750 and 883 Training Course Description

MIL STD 750/883 Training provides you with the detailed materials addressed in the sections of the MIL-STD 883 Test Method Standard Microcircuits and MIL-STD 750 Test Method Standard for Semiconductor Devices. We help you to understand these standards, know how to read them, learn how to implement them in your organization. We understand that often extracting test procedures and requirements from official materials and standards, and adjusting them to the needs of your organization is very challenging. MIL STD 750/883 Training intends to make this part of the work easier so that you can focus on performing them properly.

These standards regulate coherent procedures for testing semiconductors and microcircuits, incorporating fundamental environmental tests to determine resistance to harmful properties of environmental components and circumstances round military operations, and physical and electrical tests.

MIL STD 750 and 883 Training

TONEX Training Format

MIL STD 750/883 Training course is a combination of lectures and hands-on activities, including labs, practical activities, and hands-on workshops. The labs are conducted by using relevant tools and instruments, and the practical exercises and hands-on workshops are designed based on real-world problems and projects.


MIL STD 750/883 Training is a 3-day course designed for:

  • Testing engineers
  • Testing technicians
  • Instrumental engineers
  • Quality engineers for instruments
  • Troubleshooting team personnel, involved in resolving the microcircuits and semiconductors
  • Professionals involved in developing and overseeing the test methods of microcircuits and semiconductors
  • The individuals who work with microcircuits and semiconductors

Training Objectives

Upon the completion of MIL STD 750/883 Training, the attendees are able to:

  • Understand the scope, purposes, and applications of each MIL STD 750 and 883
  • Understand the terminology and acronyms used in these standards
  • Understand the concepts and rationale behind each of these standards
  • Become aware of the recent updates associated with these standards
  • Understand the methods procedures
  • Adjust the test methods and apply them
  • Develop protocols to follow these standards

Course Outline

Overview of MIL STD 750/883

  • MIL STD 750 definition
  • MIL STD 883 definition
  • What are microcircuits
  • What are semiconductors
  • Applications of microcircuits and semiconductors
  • Importance of MIL STD 750/883
  • Background of MIL STD 750
  • Background of MIL STD 883

Overview of MIL-STD 750


  • Scope
  • Purpose
  • Numbering system
  • Methods of reference

Application Documents

  • General
  • Government documents
  • Specifications, standards, and handbooks
    • Government documents, drawings, and publications
    • Non-Government publications
  • Order of precedence
  • Definitions
    • Symbols, and definitions
    • Abbreviations used in this standard

General Requirements

  • Test conditions
    • Permissible temperature variation in environmental chambers
    • Electrical test frequency
    • Accuracy
    • Test methods and circuits
    • Calibration requirements
  • Orientations
  • General precautions
    • Transients
    • Test conditions for electrical measurements
    • Steady-state dc measurements (method 4000)
    • Pulse measurements
    • Test circuits
    • Test method variation
    • Soldering
    • Order of connection of leads
    • Radiation precautions
    • Handling precautions
  • Continuity verification tests
    • Bias disruption
  • Requirements for HTRB and burn-in
  • Bias requirements
  • Destructive tests
  • Non-destructive tests
  • Laboratory suitability
  • Recycled, recovered, or environmentally preferable materials


  • Intended Use
  • International standardization agreement
  • Subject term (key word) listing
  • Updates

Test Methods

  • Environmental tests (1000 series)
  • Mechanical characteristics tests (2000 series)
  • Electrical characteristics tests for bipolar transistors (3000 series)
  • Circuit-performance and thermal resistance measurements (3100 series)
  • Low frequency tests (3200 series)
  • High frequency tests (3300 series)
  • Electrical characteristics tests for MOS field-effect transistors (3400 series)
  • Electrical characteristics tests for Gallium Arsenide transistors (3500 series)
  • Electrical characteristics tests for diodes (4000 series)
  • Electrical characteristics tests for microwave diodes (4100 series)
  • Electrical characteristics tests for thyristors (controlled rectifiers) (4200 series)
  • Electrical characteristics tests for tunnel diodes (4300 series)
  • High reliability space application tests (5000 series)

Overview of MIL-STD 883


  • Scope
  • Intended use of or reference to MIL-STD-883

Application Documents

  • General
  • Government documents
  • Order of precedence
  • Definitions
    • Symbols, and definitions
    • Abbreviations used in this standard

General Requirements

  • Numbering system
  • Test results
  • Test sample disposition
  • Orientation
  • Test conditions
  • General precautions
  • Recycled, recovered, and environmentally preferable materials 

Test Methods

  • Environmental tests
  • Mechanical characteristics tests
  • Electrical tests (3000 series)
  • Electrical tests (4000 series)
  • Reliability tests (5000 series)

TONEX Sample Workshop

  • Discussing both MIL-STD 750 and 833 for Large Scale Integrated Circuits Development and Acquisition for Space Vehicles
  • MIL-STD 750/833 test methods for the irradiation parts
    • Method 1017 – Neutron Irradiation
    • Method 1019 – Ionizing Radiation Test Procedure
    • Method 1032 – Package-Induced Soft Error Test Procedure
    • Method 1080 – Single Event Burnout and Single Event Gate Rupture
    • Method 3478 – Power MOSFET Electrical Dose Rate Test Method
    • Method 5001 – Wafer Lot Acceptance Testing

MIL STD 750/883 Training

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