Single Event Effects (SEE) Analysis Training by Tonex
Single Event Effects (SEE) Analysis: Understand radiation-induced upsets, latch-up, and burnout mechanisms, plus shielding and architectural strategies. Link SEE risks to mission and reliability targets. Cybersecurity note: corrupted telemetry or command paths can mask or mimic radiation events, complicating diagnostics. Enhance cybersecurity by validating data authenticity and segregating critical control channels.
The Single Event Effects (SEE) Analysis Training Course by Tonex offers an in-depth exploration of the phenomena and implications of Single Event Effects on electronic systems, particularly in high-reliability and aerospace applications.
This course is designed to equip engineers, scientists, and technical professionals with the knowledge and tools necessary to understand, analyze, and mitigate the effects of high-energy particles interacting with semiconductor devices.
Through a combination of theoretical instruction and practical application, participants will gain a comprehensive understanding of SEE mechanisms, testing methodologies, and design strategies to enhance system robustness.
Learning Objectives
Upon completing this training course, participants will be able to:
- Understand Single Event Effects: Define and categorize the various types of Single Event Effects and their impact on electronic systems.
- Identify Causes and Mechanisms: Recognize the physical phenomena leading to SEE and the mechanisms by which they affect semiconductor devices.
- Analyze Vulnerabilities: Evaluate the susceptibility of different electronic components and systems to SEE.
- Implement Testing Techniques: Apply appropriate testing and simulation methodologies to assess SEE in electronic devices.
- Design for SEE Mitigation: Develop design strategies to minimize the impact of SEE on electronic systems.
- Apply Industry Standards: Utilize relevant industry standards and guidelines in the context of SEE analysis and mitigation.
Audience
This course is designed for:
- Electrical and Electronics Engineers
- Reliability Engineers
- Aerospace Engineers
- Quality Assurance Professionals
- System Design Engineers
- Research and Development Scientists
- Technical Managers
Program Modules
Module 1: Introduction to Single Event Effects
- Overview of Radiation Environments
- Types of Single Event Effects
- Historical Context and Case Studies
- Importance of SEE in Aerospace and High-Reliability Applications
- Basic Physics of High-Energy Particles
- Introduction to Mitigation Strategies
Module 2: Mechanisms of Single Event Effects
- Charge Deposition and Collection
- Single Event Upset (SEU) Mechanisms
- Single Event Latch-up (SEL) Mechanisms
- Single Event Burnout (SEB) Mechanisms
- Single Event Gate Rupture (SEGR) Mechanisms
- Effect of Device Technology and Scaling
Module 3: SEE Testing and Characterization
- Testing Facilities and Equipment
- Particle Sources for SEE Testing
- Test Methodologies: Proton, Heavy Ion, and Neutron Testing
- Data Collection and Analysis Techniques
- SEE Rate Prediction
- Standards for SEE Testing (e.g., MIL-STD-883, JESD89)
Module 4: SEE Analysis Techniques
- Simulation Tools and Methods
- SEE Cross-Section and Rate Calculations
- Fault Tree Analysis for SEE
- Circuit-Level Simulation for SEE
- System-Level Analysis Approaches
- Case Studies and Practical Examples
Module 5: Mitigation Techniques and Design Strategies
- Radiation-Hardened by Design (RHBD) Techniques
- Redundancy and Error Correction Codes (ECC)
- Shielding and Packaging Solutions
- Device Selection and Technology Considerations
- Layout Techniques for SEE Mitigation
- Practical Implementation and Trade-offs
Module 6: Industry Standards and Compliance
- Overview of Relevant Standards (e.g., MIL-STD, JEDEC)
- Compliance Requirements for Aerospace and Defense
- Integrating SEE Analysis into Reliability Programs
- Documentation and Reporting Best Practices
- Certification Processes and Requirements
- Future Trends and Emerging Technologies in SEE Analysis