Length: 2 Days
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Single Event Effects (SEE) Analysis Training by Tonex

Cloud Exploitation Analysis Workshop

The Single Event Effects (SEE) Analysis Training Course by Tonex offers an in-depth exploration of the phenomena and implications of Single Event Effects on electronic systems, particularly in high-reliability and aerospace applications.

This course is designed to equip engineers, scientists, and technical professionals with the knowledge and tools necessary to understand, analyze, and mitigate the effects of high-energy particles interacting with semiconductor devices.

Through a combination of theoretical instruction and practical application, participants will gain a comprehensive understanding of SEE mechanisms, testing methodologies, and design strategies to enhance system robustness.

Learning Objectives

Upon completing this training course, participants will be able to:

  • Understand Single Event Effects: Define and categorize the various types of Single Event Effects and their impact on electronic systems.
  • Identify Causes and Mechanisms: Recognize the physical phenomena leading to SEE and the mechanisms by which they affect semiconductor devices.
  • Analyze Vulnerabilities: Evaluate the susceptibility of different electronic components and systems to SEE.
  • Implement Testing Techniques: Apply appropriate testing and simulation methodologies to assess SEE in electronic devices.
  • Design for SEE Mitigation: Develop design strategies to minimize the impact of SEE on electronic systems.
  • Apply Industry Standards: Utilize relevant industry standards and guidelines in the context of SEE analysis and mitigation.

Audience

This course is designed for:

  • Electrical and Electronics Engineers
  • Reliability Engineers
  • Aerospace Engineers
  • Quality Assurance Professionals
  • System Design Engineers
  • Research and Development Scientists
  • Technical Managers

Program Modules

Module 1: Introduction to Single Event Effects

  • Overview of Radiation Environments
  • Types of Single Event Effects
  • Historical Context and Case Studies
  • Importance of SEE in Aerospace and High-Reliability Applications
  • Basic Physics of High-Energy Particles
  • Introduction to Mitigation Strategies

Module 2: Mechanisms of Single Event Effects

  • Charge Deposition and Collection
  • Single Event Upset (SEU) Mechanisms
  • Single Event Latch-up (SEL) Mechanisms
  • Single Event Burnout (SEB) Mechanisms
  • Single Event Gate Rupture (SEGR) Mechanisms
  • Effect of Device Technology and Scaling

Module 3: SEE Testing and Characterization

  • Testing Facilities and Equipment
  • Particle Sources for SEE Testing
  • Test Methodologies: Proton, Heavy Ion, and Neutron Testing
  • Data Collection and Analysis Techniques
  • SEE Rate Prediction
  • Standards for SEE Testing (e.g., MIL-STD-883, JESD89)

Module 4: SEE Analysis Techniques

  • Simulation Tools and Methods
  • SEE Cross-Section and Rate Calculations
  • Fault Tree Analysis for SEE
  • Circuit-Level Simulation for SEE
  • System-Level Analysis Approaches
  • Case Studies and Practical Examples

Module 5: Mitigation Techniques and Design Strategies

  • Radiation-Hardened by Design (RHBD) Techniques
  • Redundancy and Error Correction Codes (ECC)
  • Shielding and Packaging Solutions
  • Device Selection and Technology Considerations
  • Layout Techniques for SEE Mitigation
  • Practical Implementation and Trade-offs

Module 6: Industry Standards and Compliance

  • Overview of Relevant Standards (e.g., MIL-STD, JEDEC)
  • Compliance Requirements for Aerospace and Defense
  • Integrating SEE Analysis into Reliability Programs
  • Documentation and Reporting Best Practices
  • Certification Processes and Requirements
  • Future Trends and Emerging Technologies in SEE Analysis

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