Single Event Effects (SEE) Analysis Training by Tonex
The Single Event Effects (SEE) Analysis Training Course by Tonex offers an in-depth exploration of the phenomena and implications of Single Event Effects on electronic systems, particularly in high-reliability and aerospace applications.
This course is designed to equip engineers, scientists, and technical professionals with the knowledge and tools necessary to understand, analyze, and mitigate the effects of high-energy particles interacting with semiconductor devices.
Through a combination of theoretical instruction and practical application, participants will gain a comprehensive understanding of SEE mechanisms, testing methodologies, and design strategies to enhance system robustness.
Learning Objectives
Upon completing this training course, participants will be able to:
- Understand Single Event Effects: Define and categorize the various types of Single Event Effects and their impact on electronic systems.
- Identify Causes and Mechanisms: Recognize the physical phenomena leading to SEE and the mechanisms by which they affect semiconductor devices.
- Analyze Vulnerabilities: Evaluate the susceptibility of different electronic components and systems to SEE.
- Implement Testing Techniques: Apply appropriate testing and simulation methodologies to assess SEE in electronic devices.
- Design for SEE Mitigation: Develop design strategies to minimize the impact of SEE on electronic systems.
- Apply Industry Standards: Utilize relevant industry standards and guidelines in the context of SEE analysis and mitigation.
Audience
This course is designed for:
- Electrical and Electronics Engineers
- Reliability Engineers
- Aerospace Engineers
- Quality Assurance Professionals
- System Design Engineers
- Research and Development Scientists
- Technical Managers
Program Modules
Module 1: Introduction to Single Event Effects
- Overview of Radiation Environments
- Types of Single Event Effects
- Historical Context and Case Studies
- Importance of SEE in Aerospace and High-Reliability Applications
- Basic Physics of High-Energy Particles
- Introduction to Mitigation Strategies
Module 2: Mechanisms of Single Event Effects
- Charge Deposition and Collection
- Single Event Upset (SEU) Mechanisms
- Single Event Latch-up (SEL) Mechanisms
- Single Event Burnout (SEB) Mechanisms
- Single Event Gate Rupture (SEGR) Mechanisms
- Effect of Device Technology and Scaling
Module 3: SEE Testing and Characterization
- Testing Facilities and Equipment
- Particle Sources for SEE Testing
- Test Methodologies: Proton, Heavy Ion, and Neutron Testing
- Data Collection and Analysis Techniques
- SEE Rate Prediction
- Standards for SEE Testing (e.g., MIL-STD-883, JESD89)
Module 4: SEE Analysis Techniques
- Simulation Tools and Methods
- SEE Cross-Section and Rate Calculations
- Fault Tree Analysis for SEE
- Circuit-Level Simulation for SEE
- System-Level Analysis Approaches
- Case Studies and Practical Examples
Module 5: Mitigation Techniques and Design Strategies
- Radiation-Hardened by Design (RHBD) Techniques
- Redundancy and Error Correction Codes (ECC)
- Shielding and Packaging Solutions
- Device Selection and Technology Considerations
- Layout Techniques for SEE Mitigation
- Practical Implementation and Trade-offs
Module 6: Industry Standards and Compliance
- Overview of Relevant Standards (e.g., MIL-STD, JEDEC)
- Compliance Requirements for Aerospace and Defense
- Integrating SEE Analysis into Reliability Programs
- Documentation and Reporting Best Practices
- Certification Processes and Requirements
- Future Trends and Emerging Technologies in SEE Analysis